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Dependable embedded systems

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This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.

Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;
Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;
Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

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Availability

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Detail Information

Series Title

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Call Number

621.3815 DEP d

Publisher

Cham, Switzerland : Springer Open., 2021

Collation

xiii, 608p. : ill.

Language

English

ISBN/ISSN

9783030520175

Classification

621.3815

Content Type

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Media Type

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Carrier Type

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Edition

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Subject(s)

Electronic circuits.
Computer engineering.
Internet of things.
Embedded computer systems.
Microprocessors.
Processor Architectures.

Specific Detail Info

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Statement of Responsibility

edited by Jorg Henkel and Nikil Dutt¨

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